• Skip to main content
  • Skip to footer
CAEN logo light
  • About
    • Company Profile
    • Our policy
    • Sales network
    • Innovative Projects
    • Careers
    • How to reach us
  • Products
  • Resources
    • Documentation
    • FAQ
    • Glossary
    • Certifications
    • General Conditions
    • CAEN LHC Commitment
  • Support
  • Contact
Form FactorPower SupplyDigital SpectroscopyModular Pulse ProcessingEducationalFirmware & SoftwarePowered CratesAccessoriesWeeroc ProductsDigitizer FamiliessubfamilyWithoutFamilyFamiglia di provaProva Section1Categoria con name uguale a Section 2Sezione_di_testCategoria con label uguale a SectionCategoria con tutto ugualeTest section settembre

News

Portable XRF spectrometers for multiple applications in Cultural Heritage

Home Portable XRF spectrometers for multiple applications in Cultural Heritage

Portable XRF spectrometers for multiple applications in Cultural Heritage

06/04/2021 by Nicole Filippi

The culture of innovation has always been a crucial aspect for CAEN. Today companies and public authority operate by the need for synergetic solutions to promote and improve technological transformation through diagnostic and preservation.

In a context where advanced technologies reside in the development of innovative solutions in many sectors, ENEA Tech and INFN will commit themselves to this goal by signing an agreement to promote and enhance technology transfer.

Adorazione magi CAEN
Pictures under courtesy of INFN-CHNet (Cultural Heritage Network)
Adorazione magi di Leonardo CAEN
Pictures under courtesy of INFN-CHNet (Cultural Heritage Network)

A recent example of an ad-hoc tool for cultural heritage designed by CHnet – the INFN network for Cultural Heritage – is the XRF scanner used for MA-XRF analysis in some medieval and modern art masterpieces such as “La Venaria Reale” and the unfinished work by Leonardo da Vinci, “The Adoration of the Magi” which have been the subject of diagnostic investigations by the CHNet laboratories through X-ray fluorescence measurements for images performed with the scanner developed in Florence and aimed at characterizing the drawing materials.

The XRF scanner embeds a CAEN digital multi channel analyzer (DT5780SD MCA) designed specifically for diamond and silicon detectors coupled with a CSP, in combination with other hyperspectral analysis methods.

Filed Under: Senza categoria

Copyright © 2024 CAEN S.p.A. All rights reserved.
Website by Addiction

Footer

CAEN S.p.A.

PI 00864500467 | REA: LU 102690

C.I.V.: 500.000€ | CDU A47Ø7H7

Caen Group Logo
Certificate ISO 9001:2015
Secured by Sectigo

About Us

  • Company Profile
  • Our policy
  • Sales network
  • Innovative Projects
  • Careers
  • How to reach us

Products

Applications

  • High Energy Physics
  • Astrophysics
  • Neutrino Physics
  • Dark Matter Investigation
  • Nuclear Physics
  • Material Science
  • Medical Applications
  • Homeland Security

Resources

  • Resources

Support

  • Getting Started with MyCAEN Portal

News

  • News

Contact Us

  • Contact

Login

    
  • Privacy Policy
  • Cookie Policy

Copyright © 2024 CAEN S.p.A. All rights reserved. Website by Addiction

✕